'Applied Scanning Probe Methods' examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span many topographic and dynamical surface studies.
ISBN: | 9783642065972 |
Publication date: | 12th February 2010 |
Author: | Bharat Bhushan, H O Fuchs |
Publisher: | Springer an imprint of Springer Berlin Heidelberg |
Format: | Paperback |
Pagination: | 284 pages |
Series: | Nanoscience and Technology |
Genres: |
Electronics engineering Engineering applications of polymers and composites Condensed matter physics (liquid state and solid state physics) Spectrum analysis, spectrochemistry, mass spectrometry Nanotechnology Materials science |