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Applied Scanning Probe Methods IV

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Applied Scanning Probe Methods IV Synopsis

'Applied Scanning Probe Methods' examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span many topographic and dynamical surface studies.

About This Edition

ISBN: 9783642065972
Publication date:
Author: Bharat Bhushan, H O Fuchs
Publisher: Springer an imprint of Springer Berlin Heidelberg
Format: Paperback
Pagination: 284 pages
Series: Nanoscience and Technology
Genres: Electronics engineering
Engineering applications of polymers and composites
Condensed matter physics (liquid state and solid state physics)
Spectrum analysis, spectrochemistry, mass spectrometry
Nanotechnology
Materials science