Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
| ISBN: | 9783540431176 |
| Publication date: | 24th July 2002 |
| Author: | S Morita, R Wiesendanger, E Meyer |
| Publisher: | Springer an imprint of Springer Berlin Heidelberg |
| Format: | Hardback |
| Pagination: | 439 pages |
| Series: | Nanoscience and Technology |
| Genres: |
Nanotechnology Testing of materials Scientific standards, measurement etc Materials science |
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Noncontact Atomic Force Microscopy features in the following genres: Nanotechnology, Testing of materials, Scientific standards, measurement etc, Materials science
Noncontact Atomic Force Microscopy is available in Hardback
Noncontact Atomic Force Microscopy was written by S Morita, R Wiesendanger, E Meyer and published by Springer an imprint of Springer Berlin Heidelberg
Noncontact Atomic Force Microscopy has 439 pages
Yes it is part of Nanoscience and Technology series