Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.
| ISBN: | 9780128172469 |
| Publication date: | 21st May 2020 |
| Author: | Yasuo Tohoku University, Japan Cho |
| Publisher: | Woodhead Publishing an imprint of Elsevier Science Publishing Co Inc |
| Format: | Paperback |
| Pagination: | 256 pages |
| Series: | Woodhead Publishing Series in Electronic and Optical Materials |
| Genres: |
Electronic devices and materials Materials science |
Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.
Scanning Nonlinear Dielectric Microscopy features in the following genres: Electronic devices and materials, Materials science
Scanning Nonlinear Dielectric Microscopy is available in Paperback
Scanning Nonlinear Dielectric Microscopy was written by Yasuo Tohoku University, Japan Cho and published by Woodhead Publishing an imprint of Elsevier Science Publishing Co Inc
Scanning Nonlinear Dielectric Microscopy has 256 pages
Yes it is part of Woodhead Publishing Series in Electronic and Optical Materials series