Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
| ISBN: | 9789400730946 |
| Publication date: | 1st March 2012 |
| Author: | Dongwoo Hong, KwangTing Cheng |
| Publisher: | Springer an imprint of Springer Netherlands |
| Format: | Paperback |
| Pagination: | 98 pages |
| Series: | Lecture Notes in Electrical Engineering |
| Genres: |
Computer hardware Electronics: circuits and components Computer architecture and logic design |
Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system.
Efficient Test Methodologies for High-Speed Serial Links features in the following genres: Computer hardware, Electronics: circuits and components, Computer architecture and logic design
Paperback, Hardback. Not Available.
Efficient Test Methodologies for High-Speed Serial Links was written by Dongwoo Hong, KwangTing Cheng and published by Springer an imprint of Springer Netherlands
Efficient Test Methodologies for High-Speed Serial Links has 98 pages
Yes it is part of Lecture Notes in Electrical Engineering series