Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
| ISBN: | 9783642083723 |
| Publication date: | 1st December 2010 |
| Author: | Ludwig Reimer |
| Publisher: | Springer an imprint of Springer Berlin Heidelberg |
| Format: | Paperback |
| Pagination: | 529 pages |
| Series: | Springer Series in Optical Sciences |
| Genres: |
Spectrum analysis, spectrochemistry, mass spectrometry Condensed matter physics (liquid state and solid state physics) Mathematics and Science |
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Scanning Electron Microscopy features in the following genres: Spectrum analysis, spectrochemistry, mass spectrometry, Condensed matter physics (liquid state and solid state physics), Mathematics and Science
Paperback, Hardback. Not Available.
Scanning Electron Microscopy was written by Ludwig Reimer and published by Springer an imprint of Springer Berlin Heidelberg
Scanning Electron Microscopy has 529 pages
Yes it is part of Springer Series in Optical Sciences series