The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.
A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
| ISBN: | 9783642062285 |
| Publication date: | 23rd November 2010 |
| Author: | Mathias Schubert |
| Publisher: | Springer an imprint of Springer Berlin Heidelberg |
| Format: | Paperback |
| Pagination: | 196 pages |
| Series: | Springer Tracts in Modern Physics |
| Genres: |
Electricity, electromagnetism and magnetism Laser physics Engineering applications of electronic, magnetic, optical materials Engineering: general Materials science |
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures.
Infrared Ellipsometry on Semiconductor Layer Structures features in the following genres: Electricity, electromagnetism and magnetism, Laser physics, Engineering applications of electronic, magnetic, optical materials, Engineering: general, Materials science
Paperback, Hardback. Not Available.
Infrared Ellipsometry on Semiconductor Layer Structures was written by Mathias Schubert and published by Springer an imprint of Springer Berlin Heidelberg
Infrared Ellipsometry on Semiconductor Layer Structures has 196 pages
Yes it is part of Springer Tracts in Modern Physics series