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VLSI Design and Test Part I

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VLSI Design and Test Part I Synopsis

This two-volume set CCIS 2983-2984 constitutes the referred proceedings of the 29th International Symposium on VLSI Design and Test, VDAT 2025, held in Chandigarh, India, during August 7-9, 2025.

The 105 full papers included in these volumes were carefully reviewed and selected from 415 submissions. They are organized into thematic sections as follows: Emerging Devices and Technology; Analog and Mixed Signal Design; Digital Design and Systems; Memory and Computing Architectures; RF and Embedded Systems; AI Accelerators and Advanced Architectures.

About This Edition

ISBN: 9783032263049
Publication date:
Author: VDAT Symposium
Publisher: Springer an imprint of Springer Nature Switzerland
Format: Paperback
Pagination: 574 pages
Series: Communications in Computer and Information Science
Genres: Computer hardware
Systems analysis and design

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