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Materials Reliability in Microelectronics II

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Materials Reliability in Microelectronics II Synopsis

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

About This Edition

ISBN: 9781558991606
Publication date:
Author: C V Thompson, J R Lloyd
Publisher: Cambridge University Press
Format: Hardback
Pagination: 346 pages
Series: MRS Proceedings
Genres: Materials science

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