With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include:
| ISBN: | 9781558991194 |
| Publication date: | 22nd October 1991 |
| Author: | James R Lloyd |
| Publisher: | Materials Research Society |
| Format: | Hardback |
| Pagination: | 382 pages |
| Series: | MRS Proceedings |
| Genres: |
Materials science Reliability engineering Electronics: circuits and components |
With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation.
Materials Reliability Issues in Microelectronics: Volume 225 features in the following genres: Materials science, Reliability engineering, Electronics: circuits and components
Hardback. Not Available.
Materials Reliability Issues in Microelectronics: Volume 225 was written by James R Lloyd and published by Materials Research Society
Materials Reliability Issues in Microelectronics: Volume 225 has 382 pages
Yes it is part of MRS Proceedings series