Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
| ISBN: | 9781510622364 |
| Publication date: | 30th December 2018 |
| Author: | Optical Metrology and Inspection for Industrial Applications Conference, SPIE Society, Zhongguo guang xue xue hui |
| Publisher: | SPIE |
| Format: | Paperback |
| Pagination: | 464 pages |
| Series: | Proceedings of SPIE |
| Genres: |
Applied optics |