Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
| ISBN: | 9781510611054 |
| Publication date: | 30th September 2017 |
| Author: | Modeling Aspects in Optical Metrology Conference, SPIE Society |
| Publisher: | SPIE |
| Format: | Paperback |
| Pagination: | 460 pages |
| Series: | Proceedings of SPIE. |
| Genres: |
Applied optics |