Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
| ISBN: | 9780819487438 |
| Publication date: | 30th November 2011 |
| Author: | Kevin Harding |
| Publisher: | SPIE |
| Format: | Paperback |
| Pagination: | 304 pages |
| Series: | Proceedings of SPIE |
| Genres: |
Applied optics |
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Dimensional Optical Metrology and Inspection for Practical Applications features in the following genres: Applied optics
Paperback. Not Available.
Dimensional Optical Metrology and Inspection for Practical Applications was written by Kevin Harding and published by SPIE
Dimensional Optical Metrology and Inspection for Practical Applications has 304 pages
Yes it is part of Proceedings of SPIE series