Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
| ISBN: | 9780819487421 |
| Publication date: | 30th November 2011 |
| Author: | Tetsuya Ido |
| Publisher: | SPIE |
| Format: | Paperback |
| Pagination: | 90 pages |
| Series: | Proceedings of SPIE |
| Genres: |
Applied optics |
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Time and Frequency Metrology III features in the following genres: Applied optics
Paperback. Not Available.
Time and Frequency Metrology III was written by Tetsuya Ido and published by SPIE
Time and Frequency Metrology III has 90 pages
Yes it is part of Proceedings of SPIE series