Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
| ISBN: | 9780819461988 |
| Publication date: | 30th January 2008 |
| Author: | Iraj Emami, Kenneth W Tobin, International SEMATECH |
| Publisher: | SPIE |
| Format: | Paperback |
| Series: | Proceedings of SPIE |
| Genres: |
Applied optics |
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields.
Data Analysis and Modeling for Process Control III features in the following genres: Applied optics
Paperback. Not Available.
Data Analysis and Modeling for Process Control III was written by Iraj Emami, Kenneth W Tobin, International SEMATECH and published by SPIE
Yes it is part of Proceedings of SPIE series