10% off all books and free delivery over £50
Buy from our bookstore and 25% of the cover price will be given to a school of your choice to buy more books. *15% of eBooks.

Unified Methods for VLSI Simulation and Test Generation

View All Editions (1)

The selected edition of this book is not available to buy right now.
Add To Wishlist
Write A Review

About

Unified Methods for VLSI Simulation and Test Generation Synopsis

Unified Methods for VLSI Simulation and Test Generation by KwangTing Cheng, Vishwani D Agrawal

About This Edition

ISBN: 9780792390251
Publication date:
Author: KwangTing Cheng, Vishwani D Agrawal
Publisher: Springer an imprint of Springer US
Format: Hardback
Pagination: 148 pages
Series: The Springer International Series in Engineering and Computer Science
Genres: Electrical engineering

Frequently asked questions