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VLSI Design and Test

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About

VLSI Design and Test Synopsis

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named:

  • analog and mixed signal design
  • computing architecture and security
  • hardware design and optimization
  • low power VLSI and memory design
  • device modelling
  • and hardware implementation

About This Edition

ISBN: 9789813297661
Publication date:
Author: Anirban Sengupta
Publisher: Springer Verlag, Singapore
Format: Paperback
Pagination: 775 pages
Series: Communications in Computer and Information Science
Genres: Computer hardware
Artificial intelligence
Computer security
Network security
Computer vision
Mathematical theory of computation

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