This book explains different magnetic resonance (MR) techniques and uses different combinations of these techniques to analyze defects in semiconductors and nanostructures. It also introduces novelties such as single defects MR and electron-paramagnetic-resonance-based methods: electron spin echo, electrically detected magnetic resonance, optically detected magnetic resonance and electron-nuclear double resonance - the designated tools for investigating the structural and spin properties of condensed systems, living matter, nanostructures and nanobiotechnology objects. Further, the authors address problems existing in semiconductor and nanotechnology sciences that can be resolved using MR, and discuss past, current and future applications of MR, with a focus on advances in MR methods.
The book is intended for researchers in MR studies of semiconductors and nanostructures wanting a comprehensive review of what has been done in their own and related fields of study, as well asfuture perspectives.
| ISBN: | 9783709148785 |
| Publication date: | 9th May 2018 |
| Author: | Pavel G Baranov, Hans Jürgen von Bardeleben, Fedor Jelezko, Jörg Wrachtrup |
| Publisher: | Springer an imprint of Springer Vienna |
| Format: | Paperback |
| Pagination: | 524 pages |
| Series: | Springer Series in Materials Science |
| Genres: |
Electronic devices and materials Testing of materials Spectrum analysis, spectrochemistry, mass spectrometry Nanotechnology Electricity, electromagnetism and magnetism Applied physics |