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Three-Dimensional X-Ray Diffraction Microscopy

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Three-Dimensional X-Ray Diffraction Microscopy Synopsis

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.

The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

About This Edition

ISBN: 9783662145432
Publication date:
Author: Henning Friis Poulsen
Publisher: Springer an imprint of Springer Berlin Heidelberg
Format: Paperback
Pagination: 156 pages
Series: Springer Tracts in Modern Physics
Genres: Condensed matter physics (liquid state and solid state physics)
Testing of materials

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