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VLSI Design and Test

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VLSI Design and Test Synopsis

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems.

They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

About This Edition

ISBN: 9783642420238
Publication date:
Author: VDAT Symposium
Publisher: Springer an imprint of Springer Berlin Heidelberg
Format: Paperback
Pagination: 388 pages
Series: Communications in Computer and Information Science
Genres: Computer hardware
Network hardware
Computer architecture and logic design

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