This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.
| ISBN: | 9783642056024 |
| Publication date: | 6th December 2010 |
| Author: | Bharat Bhushan, H Fuchs, Sumio Hosaka |
| Publisher: | Springer an imprint of Springer Berlin Heidelberg |
| Format: | Paperback |
| Pagination: | 476 pages |
| Series: | Nanoscience and Technology |
| Genres: |
Nanotechnology Engineering applications of polymers and composites Condensed matter physics (liquid state and solid state physics) Spectrum analysis, spectrochemistry, mass spectrometry Physical chemistry Analytical chemistry |
This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.
Applied Scanning Probe Methods I features in the following genres: Nanotechnology, Engineering applications of polymers and composites, Condensed matter physics (liquid state and solid state physics), Spectrum analysis, spectrochemistry, mass spectrometry, Physical chemistry, Analytical chemistry
Applied Scanning Probe Methods I is available in Paperback
Applied Scanning Probe Methods I was written by Bharat Bhushan, H Fuchs, Sumio Hosaka and published by Springer an imprint of Springer Berlin Heidelberg
Applied Scanning Probe Methods I has 476 pages
Yes it is part of Nanoscience and Technology series