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Structural, Syntactic, and Statistical Pattern Recognition

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Structural, Syntactic, and Statistical Pattern Recognition Synopsis

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

About This Edition

ISBN: 9783030739720
Publication date:
Author: Andrea Torsello
Publisher: Springer Nature Switzerland AG
Format: Paperback
Pagination: 378 pages
Series: Lecture Notes in Computer Science
Genres: Artificial intelligence
Algorithms and data structures
Databases
Computer applications in the social and behavioural sciences
Information technology: general topics
Maths for computer scientists

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