Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
| ISBN: | 9781628417487 |
| Publication date: | 30th October 2015 |
| Author: | José Sasián, Richard Youngworth |
| Publisher: | SPIE |
| Format: | Paperback |
| Pagination: | 277 pages |
| Series: | Proceedings of SPIE |
| Genres: |
Applied optics |
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields.
Optical System Alignment, Tolerancing, and Verification IX features in the following genres: Applied optics
Paperback. Not Available.
Optical System Alignment, Tolerancing, and Verification IX was written by José Sasián, Richard Youngworth and published by SPIE
Optical System Alignment, Tolerancing, and Verification IX has 277 pages
Yes it is part of Proceedings of SPIE series