Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
| ISBN: | 9781510611139 |
| Publication date: | 30th September 2017 |
| Author: | Jürgen Beyerer, Fernando Puente León |
| Publisher: | SPIE |
| Format: | Paperback |
| Pagination: | 256 pages |
| Series: | Proceedings of SPIE |
| Genres: |
Imaging systems and technology |
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields.
Automated Visual Inspection and Machine Vision II features in the following genres: Imaging systems and technology
Paperback. Not Available.
Automated Visual Inspection and Machine Vision II was written by Jürgen Beyerer, Fernando Puente León and published by SPIE
Automated Visual Inspection and Machine Vision II has 256 pages
Yes it is part of Proceedings of SPIE series