"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
| ISBN: | 9780824706005 |
| Publication date: | 27th November 2001 |
| Author: | Rene Van Grieken |
| Publisher: | CRC Press Inc an imprint of Taylor & Francis Inc |
| Format: | Hardback |
| Pagination: | 1004 pages |
| Series: | Practical Spectroscopy |
| Genres: |
Life sciences: general issues Spectrum analysis, spectrochemistry, mass spectrometry |