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Windowed Fringe Pattern Analysis

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Windowed Fringe Pattern Analysis Synopsis

This book provides solutions to the challenges involved in fringe pattern analysis, covering techniques for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. Both theoretical analysis and algorithm development are covered to facilitate the work of researchers and engineers.

The information presented is also appropriate as a specialised subject for students of optical and computer engineering.

About This Edition

ISBN: 9780819496416
Publication date:
Author: Qian Kemao
Publisher: SPIE an imprint of SPIE Press
Format: Paperback
Pagination: 277 pages
Series: Press Monographs
Genres: Applied optics

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