Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units (SI) requires a measurement principle that establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and innovative interferometer concepts. Aimed at students, researchers and practitioners in the field, this book will provide a far-reaching audience with key data, enabling them to better apply and understand interferometry and length metrology.
| ISBN: | 9780750315760 |
| Publication date: | 21st December 2018 |
| Author: | René Schödel |
| Publisher: | IOP Publishing an imprint of Institute of Physics Publishing |
| Format: | Hardback |
| Pagination: | 350 pages |
| Series: | IOP Expanding Physics |
| Genres: |
Applied physics |
Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units (SI) requires a measurement principle that establishes a relation between the travelling time of light in vacuum and the length to be measured.
Modern Interferometry for Length Metrology features in the following genres: Applied physics
Hardback. Not Available.
Modern Interferometry for Length Metrology was written by René Schödel and published by IOP Publishing an imprint of Institute of Physics Publishing
Modern Interferometry for Length Metrology has 350 pages
Yes it is part of IOP Expanding Physics series