This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
ISBN: | 9780367607098 |
Publication date: | 30th June 2020 |
Author: | Santanu Chattopadhyay |
Publisher: | CRC Press an imprint of Taylor & Francis Ltd |
Format: | Paperback |
Pagination: | 118 pages |
Genres: |
Electronics: circuits and components Electrical engineering |