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See below for a selection of the latest books from Engineering measurement & calibration category. Presented with a red border are the Engineering measurement & calibration books that have been lovingly read and reviewed by the experts at Lovereading. With expert reading recommendations made by people with a passion for books and some unique features Lovereading will help you find great Engineering measurement & calibration books and those from many more genres to read that will keep you inspired and entertained. And it's all free!
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology. Beginning with a description of the currently available instruments including the new addition to the field of plasma-based sources, it then gives an overview of ion solid interactions and how the different types of instrument can be applied. Chapters then describe how these machines can be applied to the field of materials science and device fabrication giving examples of recent and current activity in both these areas.
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale. It guides the reader by: helping to understand the type of information available and the requirements placed on the sample; advising on how to prepare the sample and the experiments that will generate the best-quality information and with what uncertainty. It covers the majority of practical aspects in acquiring and processing images and spectra (X-ray and energy loss). Seeing on the nanoscale is a voyage of discovery, one that can start right here.
This book is a collection of chapters linked together by a logical framework aimed at exploring the modern role of the measurement science in both the technically most advanced applications and in everyday life * Provides a unique methodological approach to understanding modern measurements * Important methods and devices are presented in a synthetic and easy-to-understand way * Includes end-of-chapter exercises and solutions
Measurement and Instrumentation: Theory and Application, Second Edition, introduces undergraduate engineering students to measurement principles and the range of sensors and instruments used for measuring physical variables. This updated edition provides new coverage of the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays, and interfaces, also featuring chapters on data acquisition and signal processing with LabVIEW from Dr. Reza Langari. Written clearly and comprehensively, this text provides students and recently graduated engineers with the knowledge and tools to design and build measurement systems for virtually any engineering application.
Can a newborn infant accurately record traumatic experience? Can early truamas be retained in memory? How would such traumatic memories affect later development? Where should we look for evidence of such traumas in adult patients? If Someone Speaks, It Gets Lighter provides surprising answers to these questions. Taking as her point of departure both her own clinical experience and case reports in the analytic literature, Lynda Share provides a thorough, at times revelatory, examination of the basic issues. She proposes that the controversy between narrative and historical truth be redefined in terms of the distinctly different memory systems involved and in terms of the special mechanisms whereby trauma, as opposed to ordinary expectable experience, becomes a major unconscious organizer of behavior and memory. Then, winding her way skillfully through contemporary debates about the limits of reconstruction, she argues persuasively that the impact of early infantile trauma can become accessible through disciplined analytic inquiry. Indeed, for Share, to forego the possibility of reconstructing such traumas in favor of an exclusively here-and-now interpretive approach is to risk perpetuating the trauma in all its pathogenicity. By contrast, when trauma can be reexperienced meaningfully in treatment, both behavioral reenactments and trauma-related transference issues can be dramatically clarified. Demonstrating her point with vivid clinical case reports, Share emphasizes the special value of dream interpretation in recovering the full psychological impact of events that occurred in the first few years of life. Through the imagistic dimension of dream formation, unconscious traumatic memories gain access to an expressive vehicle through which the patient, aided by the analyst's understanding, can begin to work through early experiences that have heretofore been dimly known but not felt.
The first edition of this book was co-published by Ane Books India, and CRC Press in 2008. This second edition is an enlarged version of the web course developed by the author at IIT Madras, and also a modified and augmented version of the earlier book. Major additions/modifications presented are in the treatment of errors in measurement, temperature measurement, measurement of thermo-physical properties, and data manipulation. Many new worked examples have been introduced in this new and updated second edition.
Photoemission (also known as photoelectron) spectroscopy refers to the process in which an electron is removed from a specimen after the atomic absorption of a photon. The first evidence of this phenomenon dates back to 1887 but it was not until 1905 that Einstein offered an explanation of this effect, which is now referred to as the photoelectric effect . Quantitative Core Level Photoelectron Spectroscopy: A Primer tackles the pragmatic aspects of the photoemission process with the aim of introducing the reader to the concepts and instrumentation that emerge from an experimental approach. The basic elements implemented for the technique are discussed and the geometry of the instrumentation is explained. The book covers each of the features that have been observed in the X-ray photoemission spectra and provides the tools necessary for their understanding and correct identification. Charging effects are covered in the penultimate chapter with the final chapter bringing closure to the basic uses of the X-ray photoemission process, as well as guiding the reader through some of the most popular applications used in current research.
Reflecting the latest changes in standards and technology, market-leading FUNDAMENTALS OF DIMENSIONAL METROLOGY, 6e combines hands-on applications with authoritative, comprehensive coverage of the principles, techniques, and devices used within today's dimensional metrology field. The Sixth Edition has been thoroughly revised and updated in direct response to reviewer feedback. The new edition features an easier to understand presentation, a new lab manual/workbook, updated photos and illustrations and updated references to measurement standards.. The text continues to use both metric and imperial systems but emphasizes metric measurement devices and concepts in all examples for greater consistency with the latest industry trends.