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Engineering measurement & calibration

See below for a selection of the latest books from Engineering measurement & calibration category. Presented with a red border are the Engineering measurement & calibration books that have been lovingly read and reviewed by the experts at Lovereading. With expert reading recommendations made by people with a passion for books and some unique features Lovereading will help you find great Engineering measurement & calibration books and those from many more genres to read that will keep you inspired and entertained. And it's all free!

Hybrid Simulation Theory, Implementation and Applications

Hybrid Simulation Theory, Implementation and Applications

Author: Victor (University of Colorado at Boulder, USA) Saouma Format: Paperback / softback Release Date: 30/08/2019

Hybrid Simulation deals with a rapidly evolving technology combining computer simulation (typically finite element) and physical laboratory testing of two complementary substructures. It is a cost effective alternative to shaking table test, and allows for the improved understanding of complex coupled systems. Traditionally, numerical simulation and physical tests have been uncoupled and performed separately. In this simulation paradigm the coupled nature of the simulation allows for improved understanding, and more efficient design since the factor of safety does not have to be arbitrarily inflated to account for uncertainties of uncoupling. It is a multidisciplinary technology which relies heavily on control theory, computer science, numerical techniques and finds applications in aerospace, civil, and mechanical engineering.

Modern Sensing Technologies

Modern Sensing Technologies

Author: Subhas Chandra Mukhopadhyay Format: Hardback Release Date: 06/09/2018

This book provides an overview of modern sensing technologies and reflects the remarkable advances that have been made in the field of intelligent and smart sensors, environmental monitoring, health monitoring, and many other sensing and monitoring contexts in today's world. It addresses a broad range of aspects, from human health monitoring to the monitoring of environmental conditions, from wireless sensor networks and the Internet of Things to structural health monitoring. Given its breadth of scope, the book will benefit researchers, practitioners, technologists and graduate students involved in the monitoring of systems within the human body, functions and activities, healthcare technologies and services, the environment, etc.

LabVIEW Style Book, The (Paperback)

LabVIEW Style Book, The (Paperback)

Author: Peter A. Blume Format: Paperback / softback Release Date: 21/11/2017

Drawing on the experiences of a world-class LabVIEW development organization, The LabVIEW Style Book is the definitive guide to best practices in LabVIEW development. Leading LabVIEW development manager Peter A. Blume presents practical guidelines or rules for optimizing every facet of your applications: ease of use, efficiency, readability, simplicity, performance, maintainability, and robustness. Blume explains each style rule thoroughly, presenting realistic examples and illustrations. He even presents nonconforming examples that show what not to do--and why not. While the illustrations in the print book are in black and white, you can download full-color versions from the publisher web site for free. Coverage includes Significance of style: How good style improves quality and actually saves time over the full project life cycle Before you code: Configuring your LabVIEW environment, and organizing your files on disk and in the LabVIEW project LabVIEW project specifications: A specialized standard for specifying LabVIEW application requirements Efficient VI layout and development: front panel, block diagram, icons, and connectors Data structures: Choosing data types, efficient use of arrays and clusters, and special considerations with nested data structures Error handling strategies: Trapping and reporting errors for robust and reliable applications Design patterns: Standard VI architectures and application frameworks that promote good style Documentation: Essential rules for source code documentation and streamlining the process Code reviews: Enforcing a style convention using a checklist, the LabVIEW VI Analyzer Toolkit, and peer reviews Appendixes: Convenient glossary and style rules summary This book will be indispensable to anyone who wants to develop or maintain quality LabVIEW applications: developers, managers, and end users alike. Additionally, it will also be valuable to those preparing for NI's Certified LabVIEW Developer or Certified LabVIEW Architect exams, which contain significant content on development style. Foreword by Darren Nattinger Preface Acknowledgments About the Author Chapter 1 The Significance of Style Chapter 2 Prepare for Good Style Chapter 3 Front Panel Style Chapter 4 Block Diagram Chapter 5 Icon and Connector Chapter 6 Data Structures Chapter 7 Error Handling Chapter 8 Design Patterns Chapter 9 Documentation Chapter 10 Code Reviews Appendix A Glossary Appendix B Style Rules Summary Index

Handbook of Measurements Benchmarks for Systems Accuracy and Precision

Handbook of Measurements Benchmarks for Systems Accuracy and Precision

Author: Adedeji B. (Air Force Institute of Technology, Dayton, Ohio, USA) Badiru Format: Paperback / softback Release Date: 26/07/2017

Planning, measuring, and paying attention to details form the basis for all successful engineering operations. Measurements pervade everything we do and must be viewed from a systems perspective. A comprehensive all-encompassing guide to measurements, Handbook of Measurements: Benchmarks for Systems Accuracy and Precision focuses on high-level engineering computations essential for benchmarks and technical innovation. The book uses a systems framework and a technically rigorous approach to systems linking of measurements-an approach that sets it apart from other handbooks. The popular saying measure twice and cut once bears out the importance of measurements in human endeavors. This handbook covers both qualitative and quantitative topics of measurement. It opens with a chapter on the fundamentals of measurement and includes coverage of human-centric measurements, such as measurement of personnel productivity and contractor performance. It concludes with three appendices on measurement, references, conversion factors, equations, formulas, and statistics for measurement. It is well understood that humans cannot manage anything that cannot be measured. All elements involved in our day-to-day decision making involve some form of measurement, whether in the kitchen, retail, sports, service operations, geographical exploration, health care delivery, worker productivity, clothing design, engineering product design, or space craft launching. Measuring an attribute of a system and then analyzing it against some standard, some specification, some best practice, or some benchmark empower a decision maker to take appropriate and timely actions. This book gives you a guide for sustainable practices to ensure accurate measurements, helping you make decisions backed by metrics.

Classification, Parameter Estimation and State Estimation An Engineering Approach Using MATLAB

Classification, Parameter Estimation and State Estimation An Engineering Approach Using MATLAB

Author: Bangjun Lei, Guangzhu Xu, Ming Feng, Yaobin Zou Format: Hardback Release Date: 27/04/2017

A practical introduction to intelligent computer vision theory, design, implementation, and technology The past decade has witnessed epic growth in image processing and intelligent computer vision technology. Advancements in machine learning methods especially among adaboost varieties and particle filtering methods have made machine learning in intelligent computer vision more accurate and reliable than ever before. The need for expert coverage of the state of the art in this burgeoning field has never been greater, and this book satisfies that need. Fully updated and extensively revised, this 2nd Edition of the popular guide provides designers, data analysts, researchers and advanced post-graduates with a fundamental yet wholly practical introduction to intelligent computer vision. The authors walk you through the basics of computer vision, past and present, and they explore the more subtle intricacies of intelligent computer vision, with an emphasis on intelligent measurement systems. Using many timely, real-world examples, they explain and vividly demonstrate the latest developments in image and video processing techniques and technologies for machine learning in computer vision systems, including: * PRTools5 software for MATLAB especially the latest representation and generalization software toolbox for PRTools5 * Machine learning applications for computer vision, with detailed discussions of contemporary state estimation techniques vs older content of particle filter methods * The latest techniques for classification and supervised learning, with an emphasis on Neural Network, Genetic State Estimation and other particle filter and AI state estimation methods * All new coverage of the Adaboost and its implementation in PRTools5. A valuable working resource for professionals and an excellent introduction for advanced-level students, this 2nd Edition features a wealth of illustrative examples, ranging from basic techniques to advanced intelligent computer vision system implementations. Additional examples and tutorials, as well as a question and solution forum, can be found on a companion website.

Measurement Technology for Micro-Nanometer Devices

Measurement Technology for Micro-Nanometer Devices

Author: Wendong Zhang, Xing Fu, Tiekin Shi, Zongmin Ma Format: Hardback Release Date: 26/10/2016

A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale Highlights the advanced research work from industry and academia in micro-nano devices test technology Written at both introductory and advanced levels, provides the fundamentals and theories Focuses on the measurement techniques for characterizing MEMS/NEMS devices

Mem12023a Perform Engineering Measurements

Mem12023a Perform Engineering Measurements

Author: Warren Blackadder Format: Paperback / softback Release Date: 08/11/2015

This unit covers performing measurement skills requiring straightforward use of mechanical measuring devices and associated calculations. This unit covers straightforward measurement using devices which incorporate visual indications representing units of measurement. It applies to the use of measuring devices in a range of manufacturing, engineering and related environments. It includes, where required, adjustment of measuring devices through simple means and typically includes zeroing or scale adjustment. Measurements may be expressed in metric or imperial units. All measurements are undertaken to standard operating procedures. Electrical/electronic devices used are those not requiring the connection or disconnection of circuitry. Topics Include: Measuring Devices, Measurement Practices, Rulers, Micrometres, Vernier Callipers, Gauges, Dumpy Level, Combination Square, Ancillary Measuring Equipment & Hardness Testing.

Handbook of Measurements Benchmarks for Systems Accuracy and Precision

Handbook of Measurements Benchmarks for Systems Accuracy and Precision

Author: Adedeji B. (Air Force Institute of Technology, Dayton, Ohio, USA) Badiru Format: Hardback Release Date: 03/11/2015

Planning, measuring, and paying attention to details form the basis for all successful engineering operations. Measurements pervade everything we do and must be viewed from a systems perspective. A comprehensive all-encompassing guide to measurements, Handbook of Measurements: Benchmarks for Systems Accuracy and Precision focuses on high-level engineering computations essential for benchmarks and technical innovation. The book uses a systems framework and a technically rigorous approach to systems linking of measurements-an approach that sets it apart from other handbooks. The popular saying measure twice and cut once bears out the importance of measurements in human endeavors. This handbook covers both qualitative and quantitative topics of measurement. It opens with a chapter on the fundamentals of measurement and includes coverage of human-centric measurements, such as measurement of personnel productivity and contractor performance. It concludes with three appendices on measurement, references, conversion factors, equations, formulas, and statistics for measurement. It is well understood that humans cannot manage anything that cannot be measured. All elements involved in our day-to-day decision making involve some form of measurement, whether in the kitchen, retail, sports, service operations, geographical exploration, health care delivery, worker productivity, clothing design, engineering product design, or space craft launching. Measuring an attribute of a system and then analyzing it against some standard, some specification, some best practice, or some benchmark empower a decision maker to take appropriate and timely actions. This book gives you a guide for sustainable practices to ensure accurate measurements, helping you make decisions backed by metrics.

Introduction to Time-of-Flight Secondary Ion Mass Spectrometry

Introduction to Time-of-Flight Secondary Ion Mass Spectrometry

Author: Sarah Fearn Format: Paperback / softback Release Date: 16/10/2015

This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

Introduction to Focused Ion Beam Nanometrology

Introduction to Focused Ion Beam Nanometrology

Author: David C. Cox Format: Paperback / softback Release Date: 01/10/2015

This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology. Beginning with a description of the currently available instruments including the new addition to the field of plasma-based sources, it then gives an overview of ion solid interactions and how the different types of instrument can be applied. Chapters then describe how these machines can be applied to the field of materials science and device fabrication giving examples of recent and current activity in both these areas.

Nanometrology Using Transmission Electron Microscopy

Nanometrology Using Transmission Electron Microscopy

Author: Vlad Stolojan Format: Paperback / softback Release Date: 30/09/2015

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale. It guides the reader by: helping to understand the type of information available and the requirements placed on the sample; advising on how to prepare the sample and the experiments that will generate the best-quality information and with what uncertainty. It covers the majority of practical aspects in acquiring and processing images and spectra (X-ray and energy loss). Seeing on the nanoscale is a voyage of discovery, one that can start right here.