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Conductive Atomic Force Microscopy

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Conductive Atomic Force Microscopy Synopsis

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

About This Edition

ISBN: 9783527340910
Publication date: 11th October 2017
Author: Mario Lanza
Publisher: Blackwell Verlag GmbH an imprint of Wiley-VCH Verlag GmbH
Format: Hardback
Pagination: 384 pages
Genres: Nanotechnology
Electronics engineering
Electronic devices and materials