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Thin Film Analysis by X-Ray Scattering

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Thin Film Analysis by X-Ray Scattering Synopsis

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

About This Edition

ISBN: 9783527310524
Publication date: 15th November 2005
Author: Mario (IHP Microelectronics, Frankfurt/Oder, Germany) Birkholz
Publisher: Blackwell Verlag GmbH an imprint of Wiley-VCH Verlag GmbH
Format: Hardback
Pagination: 378 pages
Genres: Materials / States of matter