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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results. Includes papers relating to the analysis of integrated circuits, MEMS, nanodevices, optoelectronics, discrete and passive components, electronic packaging, card level components, and electronic systems in the following areas: New and emerging analytical concepts Diagnostic testing and debug Physical fault isolation (optical, thermal, magnetic, etc.) Electrical characterisation and nanoprobing Scanning probe technology Microscopy (SEM, TEM, light microscopy, etc.) Physical circuit-edit techniques (FIB, laser, etc.) Sample preparation (milling, polishing, etching, grinding, etc.) Chemical and materials analysis (Auger, SIMS, RBS, etc.) Metrology and in-line characterisation and analysis Yield and reliability enhancement Competitive analysis Image processing Analytical thought process Laboratory and environmental safety and green processes Automation Laboratory management and finance Future challenges, especially those relating to the deep nanoscale regime
|Publication date:||30th November 2013|
|Publisher:||A S M International|
|Format:||Paperback / softback|
ASM International is a materials science and engineering society where materials users, producers, and manufacturers converge to do business.More About ASM International