Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
| ISBN: | 9780128120866 |
| Publication date: | 24th October 2017 |
| Author: | Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; Hawkes |
| Publisher: | Academic Press Inc an imprint of Elsevier Science Publishing Co Inc |
| Format: | Hardback |
| Pagination: | 248 pages |
| Genres: |
Imaging systems and technology |